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Other articles related with "equivalent oxide thickness"：
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58106 |
Chen-Xi Fei(费晨曦), Hong-Xia Liu(刘红侠), Xing Wang(汪星), Dong-Dong Zhao(赵冬冬), Shu-Long Wang(王树龙), Shu-Peng Chen(陈树鹏) |
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Influences of different structures on the characteristics of H2O-based and O3-based LaxAlyO films deposited by atomic layer deposition |
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Chin. Phys. B
2016 Vol.25 (5): 58106-058106
[Abstract]
(666)
[HTML 1 KB]
[PDF 385 KB]
(381)
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67701 |
Sun Jia-Bao (孙家宝), Yang Zhou-Wei (杨周伟), Geng Yang (耿阳), Lu Hong-Liang (卢红亮), Wu Wang-Ran (吴汪然), Ye Xiang-Dong (叶向东), David Zhang Wei (张卫), Shi Yi (施毅), Zhao Yi (赵毅) |
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Equivalent oxide thickness scaling of Al2O3/Ge metal-oxide-semiconductor capacitors with ozone post oxidation |
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Chin. Phys. B
2013 Vol.22 (6): 67701-067701
[Abstract]
(718)
[HTML 1 KB]
[PDF 333 KB]
(635)
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